Header menu link for other important links
X
Studies on ferroelectric and nanomechanical response of single-layered PZT thick film for energy harvester applications
, Martando Rath, Venkatachalam Natarajan
Published in Taylor and Francis Inc.
2019
Volume: 551
   
Issue: 1
Pages: 17 - 23
Abstract

We have made an attempt to fabricate free standing warpage free PZT thick films of 100 µm thickness by tape casting method. The poly crystalline nature and nanoscale polarization switching of free standing thick film were confirmed using X-ray diffraction technique and piezo force microscopy, respectively. The piezoelectric coefficient (d33) of 100 µm free-standing Pb(Zr0.56Ti0.44)O3 [PZT] thick film was calculated using double beam laser interferometer and found to be 400 pm/V. From the results, it indicates that free-standing PZT thick films are suitable candidate for miniaturization of harvesting device by directly bonding them on microsystem components for microelectromechanical systems (MEMS) applications. © 2019, © 2019 Taylor & Francis Group, LLC.

About the journal
JournalData powered by TypesetFerroelectrics
PublisherData powered by TypesetTaylor and Francis Inc.
ISSN00150193
Open AccessNo
Concepts (19)
  •  related image
    Electromechanical devices
  •  related image
    Energy harvesting
  •  related image
    Interferometers
  •  related image
    Laser interferometry
  •  related image
    Lead compounds
  •  related image
    MEMS
  •  related image
    Piezoelectricity
  •  related image
    TITANIUM COMPOUNDS
  •  related image
    Transducers
  •  related image
    Zirconium compounds
  •  related image
    Energy harvester
  •  related image
    FREE STANDING THICK FILMS
  •  related image
    Micro electromechanical system (mems)
  •  related image
    NANOMECHANICAL RESPONSE
  •  related image
    NANOSCALE POLARIZATION
  •  related image
    Piezoelectric coefficient
  •  related image
    TAPE CASTING
  •  related image
    X-ray diffraction techniques
  •  related image
    Thick films