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Polarization dependent electro-optic effect in SOI waveguides with laterally diffused P-N junction
Riddhi Nandi,
Published in Institute of Electrical and Electronics Engineers Inc.
2018
Volume: 2018-January
   
Pages: 1 - 2
Abstract
Polarization dependent plasma dispersion effect is investigated for single-mode SOI waveguides (λ ∼ 1550 nm) with laterally diffused p-n junction. The lateral p-n junction of desired length is formed initially in 1.5 μm thick SOI layer (BOX-2 μm) by diffusion doping and then the single-mode waveguides with appropriate design parameters (width W, height H, and slab height h) is defined along the junction for simulations studies to estimate Vπ and Lπ. It is observed that the device becomes more and more polarization sensitive as the device layer thickness (H) decreases, which is justified appropriately by calculating polarization dependent confinement factors as well as free carrier overlaps with the corresponding guided modes. © 2018 IEEE.
About the journal
JournalData powered by Typeset2018 3rd International Conference on Microwave and Photonics, ICMAP 2018
PublisherData powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
Open AccessNo
Concepts (12)
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    Photonics
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    Semiconductor junctions
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    Waveguides
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    APPROPRIATE DESIGNS
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    Confinement factor
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    ELECTROOPTIC EFFECTS
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    Free carriers
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    PLASMA DISPERSION EFFECTS
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    Polarization sensitive
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    SINGLE MODE WAVEGUIDES
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    SOI WAVEGUIDES
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    Polarization