Header menu link for other important links
X
Passivation study for low dark current InGaAs/InP PIN diode
V. Naveen Kumar, P. R.S. Rao, ,
Published in Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States
2000
Volume: 3975
   
Abstract
Low dark current InGaAs/InP mesa structured PIN diode detectors for operation at 1.1-1.7 μm have been fabricated. Dark current densities of 16 μA/cm2 were achieved. The diodes have been passivated by polyimide, SiO2 and SiN layers and their effects on the dark current were studied. It was conclusively proved that polyimide passivation had the best results in terms of low dark current, reproducibility and long-term stability of the device.
About the journal
JournalProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States
ISSN0277786X
Open AccessNo
Concepts (9)
  •  related image
    Passivation
  •  related image
    Photodetectors
  •  related image
    POLYIMIDES
  •  related image
    Semiconducting indium gallium arsenide
  •  related image
    Semiconducting indium phosphide
  •  related image
    Silica
  •  related image
    Silicon nitride
  •  related image
    Low dark current
  •  related image
    Semiconductor diodes