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Development of a Microprocessor-Based Four Probe DC Resistivity Setup for Tc Measurement of Superconducting MaterialsPublished in
1990
DOI: 10.1109/19.58628
Volume: 39
Issue: 5
Pages: 792 - 795
The design of a microprocessor-based resistivity measurement system for high Tc superconducting materials is described. This design includes interfacing an Intel 8085 microprocessor system with an IBM compatible personal computer (PC) through RS-232C serial communication. This design is used to measure resistivity for superconducting samples of YBa2Cu3O7 −x and strontium/potassium substituted YBa2Cu3O7−x. A correction method is also described for the parameters whose values are changing throughout the measurement period, to minimize the measurement errors. © 1990 IEEE
Topics: Personal computer (53)%53% related to the paper
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About the journal
| Journal | IEEE Transactions on Instrumentation and Measurement |
|---|---|
| ISSN | 00189456 |
| Open Access | No |
Concepts (8)
Electric measurements - resistance- ELECTRIC MEASURING INSTRUMENTS - COMPUTER APPLICATIONS
- Probes
- FOUR PROBE DC RESISTIVITY
- MICROPROCESSOR-BASED RESISTIVITY MEASUREMENT
- Oxide superconductors
- Yttrium barium copper oxides
- High temperature superconductors
