Resistivity and thermopower measurements were performed on thin films of Bi2(Te0.8Se0.2)3 prepared by flash evaporation technique. Applying the Jain-Verma theory to the experimental data of Bi2(Te0.8Se0.2)3, scattering index parameter was evaluated. The value of scattering index parameter was found to lie between -0.3 and -0.2. This indicates the presence of other scattering mechanisms, in addition to the lattice scattering. © 2002 Elsevier Science B.V. All rights reserved.