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Phase transformations during high-speed, high-temperature scratching of silicon
Published in American Society of Mechanical Engineers
2017
Volume: 2
   
Abstract
Higher temperature assisted processing of silicon, such as in heat-assisted diamond turning, is often being considered to improve surface integrity. At higher temperatures and under mechanical loading and unloading, caused by the moving tool, silicon deforms plastically often in association with occurrence of phase transformations. This paper investigates such phase transformations in rotational scratching of single crystal (100) ptype silicon with a conical diamond tool under various furnacecontrolled temperatures ranging from room temperature to 500°C and at scratching speeds comparable to that used in the diamond turning process (1 m/s). Phase transformation study, using Raman spectroscopy, at various crystal orientations, show differences in phases formed at various temperatures when compared to that reported in indentation. The tendency to form phases is compared between scratched and diamond turned surfaces at room temperature, and also with that reported at low scratching speeds in the literature. Analysis of depths of the scratched groove indicates that that at temperatures beyond a certain threshold, plastic deformation and significant elastic recovery may be causing shallow grooves. This study is expected to help tune heat-assisted diamond turning conditions to improve surface formation. © Copyright 2017 ASME.
About the journal
JournalASME 2017 12th International Manufacturing Science and Engineering Conference, MSEC 2017 collocated with the JSME/ASME 2017 6th International Conference on Materials and Processing
PublisherAmerican Society of Mechanical Engineers
Open AccessNo
Concepts (18)
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    Crystal orientation
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    Diamonds
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    INTERMETALLICS
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    Manufacture
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    Phase transitions
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    Silicon
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    Single crystals
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    Turning
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    Unloading
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    ASSISTED PROCESSING
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    Diamond turning
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    DIAMOND-TURNED SURFACES
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    High temperature
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    Mechanical loading
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    SILICON PHASE
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    SURFACE FORMATION
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    Surface integrity
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    Silicon wafers