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Phase shifting by a rotating polarizer in white-light interferometry for surface profiling
Mahendra Prasad Kothiyal, Rajpal Singh Sirohi
Published in
1999
Volume: 46
   
Issue: 6
Pages: 993 - 1001
Abstract
In white-light interferometry, the position of the peak of the fringe contrast function is directly related to the surface height of the object. In this paper, we present a phase-shifting technique to determine the fringe contrast function using a rotating polarizer, which introduces an achromatic phase shift. The effect of introducing the rotating polarizer phase shifter at the output of the white-light interferometer has been studied. It is shown that the peak of the fringe contrast function does not occur for zero path difference between the arms of the interferometer; it is rather shifted by a constant amount. This shift, however, does not introduce any error in relative height measurements. The experimental results are presented. © 1999 Taylor & Francis Group, LLC.
About the journal
JournalJournal of Modern Optics
ISSN09500340
Open AccessNo
Concepts (7)
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    Birefringence
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    Light polarization
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    Phase shift
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    ROTATING POLARIZERS
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    SURFACE PROFILING
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    White light interferometry
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    Interferometry