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Integrated Optical Linear Edge Filters Using Apodized Sub-Wavelength Grating Waveguides in SOI
R. Sumi, Nandita das Gupta,
Published in Institute of Electrical and Electronics Engineers Inc.
2019
Volume: 31
   
Issue: 17
Pages: 1449 - 1452
Abstract
An integrated optical apodized sub-wavelength grating waveguide is designed and demonstrated exhibiting high-extinction edge-filter characteristics with a linear roll-off in the dB scale. For a given waveguide cross-sectional geometry with fixed grating duty cycle and period, it has been shown that the apodized device length L-{g} and width W-{m} are the two important parameters deciding the band-edge position, roll-off and broadband extinction around the Bragg wavelength. The experimental results from fabricated devices ( L-{g} = 70\,\,\mu \text{m} and W-{m} = 2.5\,\,\mu \text{m} ) in silicon-on-insulator substrates (device layer 220 nm and buried oxide layer \sim ~2~\mu \text{m} ) show a smooth band-edge roll-off of > 3.5 dB/nm ( \lambda -{edge} \sim ~1550 nm) with a stopband ( \Delta \lambda -{sb}>50 nm) extinction of > 40 dB and a nearly flat-top passband ( \Delta \lambda -{pb}>100 nm) with negligible insertion loss of 0.5 dB. © 1989-2012 IEEE.
About the journal
JournalData powered by TypesetIEEE Photonics Technology Letters
PublisherData powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
ISSN10411135
Open AccessNo
Concepts (17)
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    Diffraction gratings
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    Integrated optics
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    OPTICAL FILTERS
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    Optical waveguides
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    Passive filters
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    Silicon on insulator technology
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    Silicon photonics
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    Substrates
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    Band edge position
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    BRAGG WAVELENGTH
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    BURIED OXIDE LAYERS
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    CROSSSECTIONAL GEOMETRY
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    DEVICE LAYERS
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    FABRICATED DEVICE
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    SILICON-ON-INSULATOR SUBSTRATES
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    Sub-wave length grating
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    Waveguide filters