The structural and electrical transport properties of Ho1-x Mmx Co2 (x=0, 0.1, 0.2, 0.3, and 0.4 and Mm=mischmetal) alloys and their hydrides in the hydrogen concentration (y) range of 0≤y≤3.6 have been determined through the powder x-ray diffraction (XRD) and temperature dependence of electrical resistivity [ρ (T)] measurements. At room temperature, these compounds crystallize in Mg Cu2 -type (C15) structure. The crystalline nature and lattice expansion of hydrogenated alloys have been studied using the hydrogen concentration dependence of XRD peak analysis indicating the coexistence of two hydride phases at intermediate hydrogen concentrations. The temperature dependence of the electrical resistivity of alloys has been discussed based on the conduction electron scattering and spin fluctuation scattering mechanisms. The changes in magnetic ordering and transition temperature upon Mm substitution and at different concentrations of hydrogen loadings have been discussed. Furthermore, the transformation from metalliclike conductivity to thermally activated conduction mechanism and different conduction regimes of temperature dependent resistivity upon increasing H concentration have been well described by Kondo-type and electron-electron scattering effects. © 2007 American Institute of Physics.