Header menu link for other important links
X
Finite element modelling of stress-induced fracture in Ti-Si-N films
Published in Trans Tech Publications
2014
Volume: 553
   
Pages: 10 - 15
Abstract
Nanocomposite coating films have been increasingly used in industrial applications because of their unique mechanical and physical properties. Residual stresses generated during the growth of sputter-deposited thin films due to a strain mismatch between the film and the substrate may lead to significant failure problems. Large residual stresses may generate buckling, delamination and film fracture. Although buckles with cracks in thin films have been experimentally observed, their origins are still not well understood. In this work, finite element simulations in Abaqus/Explicit are employed to study buckling and cracking in Ti-Si-N films on a silicon substrate. Residual stresses in the film are generated using two loading methods: 1) Eigenstrain is applied via a temperature field; 2) An initial stress field is applied. Cracking is modelled using an elastic material model with a brittle fracture criterion that takes into account the tensile strength of the material to initiate damage. It is found that while both loading methods lead to similar buckling patterns and stresses, an initial stress field generates premature film failure and thus the thermal field loading should be used. The numerical model fairly predicted the cracking patterns observed in the experiments. © (2014) Trans Tech Publications, Switzerland.
About the journal
JournalApplied Mechanics and Materials
PublisherTrans Tech Publications
ISSN16609336
Open AccessNo
Concepts (24)
  •  related image
    Brittle fracture
  •  related image
    Buckling
  •  related image
    Computational mechanics
  •  related image
    Crack initiation
  •  related image
    Cracks
  •  related image
    Film growth
  •  related image
    Finite element method
  •  related image
    Industrial applications
  •  related image
    Metallic films
  •  related image
    Nanocomposite films
  •  related image
    Residual stresses
  •  related image
    Silicon
  •  related image
    Tensile strength
  •  related image
    Thin films
  •  related image
    TITANIUM COMPOUNDS
  •  related image
    Finite element modelling
  •  related image
    Finite element simulations
  •  related image
    FRACTURE CRITERIA
  •  related image
    INITIAL STRESS FIELD
  •  related image
    Mechanical and physical properties
  •  related image
    Nano-composite coating
  •  related image
    Silicon substrates
  •  related image
    SPUTTER-DEPOSITED THIN FILMS
  •  related image
    Loading