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Fabrication of reliable RF MEMS switches in CPW configuration
Published in
2009
Volume: 74
   
Pages: 259 - 263
Abstract
This paper describes a new fabrication technique for RF MEMS switches where the coplanar waveguide (CPW) is fabricated in a basin. A planar profile and good coverage at the edges in a basin is achieved by spinning and baking the sacrificial positive photoresist (PPR) in multiple steps to fill the basin. The basin structure allows an increase in the length of the membrane resulting in lower pull-in voltage and better isolation. The PPR is removed using Piranha solution (H2SO4:H2O2::3:1). Structures with the gap of about 2.5 μm and the thickness of the gold membrane varying from 1μm to 2.5 μm have been successfully realized. © (2009) Trans Tech Publications.
About the journal
JournalAdvanced Materials Research
ISSN10226680
Open AccessNo
Concepts (12)
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    BASIN STRUCTURES
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    Fabrication technique
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    PIRANHA SOLUTIONS
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    PLANARIZATION
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    Pull-in voltage
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    RF-MEMS SWITCHES
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    Coplanar waveguides
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    Electric switches
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    Fabrication
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    MEMS
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    Microelectromechanical devices
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    Membrane structures