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Annealing and thickness effects on the electrical resistance of vacuum-deposited tin antimonide alloy films
V. Damodara das, M. S. Jagadeesh
Published in
Volume: 24
Issue: 2
Pages: 203 - 210
Tin antimonide alloy films, vacuum-deposited at room temperature onto glass substrates, were heated to a maximum temperature of about 300 °C and the changes in their electrical resistance with temperature were recorded. The initial lattice distortion energy spectra of the films have been determined from the resistance-temperature data. It is found that the F0(E)max and Emax values vary from 200×10-4 to 700×10-4 ohms;cm/eV and from 1.55 to 1.74 eV respectively and that they depend upon the thickness of the film. The resistivities of the films due to thermal vibrations alone have been calculated and it is found that the calculated resistivity values for films of different thicknesses are in good agreement with the size effect theory. © 1974.
About the journal
JournalThin Solid Films
Open AccessNo
Concepts (4)
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    Electric conductivity
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    Heat treatment - annealing
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    Tin compounds