The uplink of multi-user massive multi-input-multi-output systems, in which the base station is equipped with a low-resolution analog-to-digital converter architecture, is considered in this letter. All the channels are assumed to undergo independent and nonidentically distributed Nakagami-m fading. By means of moment matching, the signal-to-interference-plus-quantization-noise ratio at the output of maximum ratio combiner is approximated by a gamma random variable. Using this approximate probability density function, tight approximations for metrics, such as outage probability and rate, are derived. The gap between the simulation and the approximate result is negligible. In addition, for a large number of antennas, a decrease in the number of antennas should be accompanied by a proportionate decrease in the threshold to maintain the same outage probability. © 1997-2012 IEEE.

Sheetal Kalyani

Department of Electrical Engineering

Muralikrishnan S. Srinivasan

Antennas

MIMO systems

Mobile telecommunication systems

Multiplexing equipment

Probability

Quantization (signal)

Rating

Analog to digital converters

Approximate results

GAMMA RANDOM VARIABLES

MAXIMUM RATIO COMBINERS

MULTI INPUT MULTI OUTPUT SYSTEMS

NAKAGAMI FADING

Outage Probability

SIGNAL TO INTERFERENCE

Probability density function

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IIT Madras

Analysis of Massive MIMO With Low-Resolution ADC in Nakagami- ${m}$ Fading

IEEE Communications Letters

Using tools from extreme value theory (EVT), it is proved that when the user signal and the interferer signals undergo independent and non-identically distributed (i.n.i.d.) κ -μ shadowed fading, the limiting distribution of the maximum of L independent and identically distributed (i.i.d.) signal-to-interference ratio (SIR) random variables (RVs) is a Frechet distribution. It is observed that this limiting distribution is close to the true distribution of maximum for maximum SIR evaluated over moderate L. Furthermore, moments of the maximum RV is shown to converge to the moments of the Frechet RV. In addition, the rate of convergence of the actual distribution of the maximum to the Frechet distribution is derived and analyzed for different κ and μ parameters. Finally, results from the stochastic ordering are used to analyze the variation in the limiting distribution with respect to the variation in source fading parameters. These results are then used to derive upper bound for the rate in full array selection (FAS) schemes for the antenna selection and the asymptotic outage probability and the ergodic rate in maximum-sum-capacity (MSC) scheduling systems. © 1972-2012 IEEE.

Fulltext

IEEE Transactions on Communications

Asymptotic Maximum Order Statistic for SIR in κ -μ Shadowed Fading

Analytical evaluation of outage probability (OP) and capacity for κ-μ and η-μ fading channel distributions, which model line-of-sight and non line-of-sight propagation effects, respectively, has been in focus lately. We derive an approximate closed form expression for OP and a simple expression for capacity in terms of hypergeometric functions, when the user experiences κ-μ fading and interferers experience η-μ fading with arbitrary parameters. Simulation results are presented along with analytical evaluation results, which prove that the approximations made for analytical evaluation are tight. © 1997-2012 IEEE.

Analysis of outage probability and capacity for κ-μ/η-μ faded channel

IEEE Transactions on Wireless Communications

Outage Probability Analysis and Resolution Profile Design for Massive MIMO Uplink With Mixed-ADC

Journal of Communications and Networks

Antenna subset selection for massive MIMO systems: A trace-based sequential approach for sum rate maximization

IEEE Journal on Selected Areas in Communications

Performance Analysis of Mixed-ADC Massive MIMO Systems Over Rician Fading Channels

2016 IEEE Sensor Array and Multichannel Signal Processing Workshop (SAM)

Antenna selection in massive MIMO systems: Full-array selection or subarray selection?

Analysis of Massive MIMO with Low-Resolution ADC in Nakagami-m Fading

Journal	Data powered by TypesetIEEE Communications Letters
Publisher	Data powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
ISSN	10897798
Open Access	No