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49 Publications
26 Journals
Deleep R. Nair
Professor
Department of Electrical Engineering
deleep@ee.iitm.ac.in (Work)
+91-44-2257-4471 (Work)
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Publications - 49
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Publications (49)
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Publications (49)
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Articles
Piezoelectric-on-Silicon Array Resonators with Asymmetric Phononic Crystal Tethering
Deleep R. Nair
and
Amitava Dasgupta
2017 | Institute of Electrical and Electronics Engineers Inc.
Articles
Novel RF MEMS capacitive switches with design flexibility for multi-frequency operation
Amitava Dasgupta
and
Deleep R. Nair
2017 | Institute of Physics Publishing
Conferences
Analysis of systematic and random variation of gate-induced drain leakage in silicon-germanium channel pFET
Deleep R. Nair
2017 | Institute of Electrical and Electronics Engineers Inc.
Articles
Effects of trap-assisted tunneling on gate-induced drain leakage in silicon-germanium channel p-type FET for scaled supply voltages
Deleep R. Nair
2016 | Japan Society of Applied Physics
Articles
Open Access
Study of the Effect of Surface Roughness on the Performance of RF MEMS Capacitive Switches Through 3-D Geometric Modeling
Amitava Dasgupta
and
Deleep R. Nair
2016 | Institute of Electrical and Electronics Engineers Inc.
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Conferences
Drift compensation using bulk feedback in a neural recording system based on open-gate FET
Deleep R. Nair
and
M Ramasubba Reddy
2015 | Institute of Electrical and Electronics Engineers Inc.
Articles
Effect of germanium preamorphization implant on performance and gate-induced drain leakage in SiGe channel pFET
Deleep R. Nair
2015 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Modeling of gate-induced drain leakage mechanisms in silicon-germanium channel pFET
Deleep R. Nair
2014 | Institute of Electrical and Electronics Engineers Inc.
Articles
Analysis of gate-induced drain leakage mechanisms in silicon-germanium channel pFET
Deleep R. Nair
2014 | Institute of Electrical and Electronics Engineers Inc.
Conferences
A novel FinFET with dynamic threshold voltage
Deleep R. Nair
and
Amitava Dasgupta
2014 | Institute of Electrical and Electronics Engineers Inc.
Other
PMOSFET layout dependency with embedded SiGe Source/Drain at POLY and STI edge in 32/28nm CMOS technology
Deleep R. Nair
,
Song L.
,
...
,
Kaste E.
(25 authors)
2012 | IEEE
Other
A manufacturable dual channel (Si and SiGe) high-k metal gate CMOS technology with multiple oxides for high performance and low power applications
Deleep R. Nair
,
Mangala S. Krishnan
,
...
,
Sivakumar Palaniappan
,
...
,
Sridharakumar Narasimhan
,
...
,
Chudzik M.
(63 authors)
2011 | IEEE
Journal
Novel high-performance analog devices for advanced low-power high-k metal gate complementary metal-oxide-semiconductor technology
Deleep R. Nair
,
Han J.-P.
,
...
,
Nandan Sudarsanam
,
...
,
Neumueller W.
(45 authors)
2011 | IOP
Other
New layout dependency in high-k/metal gate MOSFETs
Deleep R. Nair
,
Hamaguchi M.
,
...
,
Matsuoka F.
(43 authors)
2011 | IEEE
Other
Competitive and cost effective high-k based 28nm CMOS technology for low power applications
Deleep R. Nair
,
Arnaud F.
,
...
,
Sampson R.
(32 authors)
2009 | IEEE
Other
Scaling of 32nm low power SRAM with high-K metal gate
Deleep R. Nair
,
Yang H.S.
,
...
,
Jim Libby
,
...
,
Stiffler S.
(33 authors)
2008 | IEEE
Other
32nm general purpose bulk CMOS technology for high performance applications at low voltage
Deleep R. Nair
,
Arnaud F.
,
...
,
Jitendra Shital Sangwai
,
...
,
Jim Libby
,
...
,
Steegen A.
(36 authors)
2008 | IEEE
Other
A cost effective 32nm high-K/metal gate CMOS technology for low power applications with single-metal/gate-first process
Deleep R. Nair
,
Chen X.
,
...
,
Jim Libby
,
...
,
Ranjith Mohan
,
S Krishna
,
...
,
Kothandaraman Ramanujam
,
...
,
Steegen A.
(46 authors)
2008 | IEEE
Journal
Using soft secondary electron programming to reduce drain disturb in floating-gate NOR flash EEPROMs
Deleep R. Nair
,
Kumar P.B.
and
Pallab Sinha Mahapatra
2006 | IEEE
Journal
Explanation of P/E cycling impact on drain disturb in flash EEPROMs under CHE and CHISEL programming operation
Deleep R. Nair
,
Pallab Sinha Mahapatra
,
...
,
Bude J.D.
(4 authors)
2005 | IEEE
Showing 21-40 of 49 results
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