Header menu link for other important links
X
Variation of conduction activation energy and resistivity with thickness in Pb0.5Sn0.5Te thin films
V. Damodara das, C. Bahulayan
Published in
1995
Volume: 93
   
Issue: 11
Pages: 949 - 951
Abstract
The effect of film thickness on the conduction activation energy and resistivity of flash evaporated Pb0.5Sn0.5Te thin films has been investigated. The conduction activation energy has been found to decrease with an increase in thickness. The observed variation of conduction activation energy with thickness has been explained using Seto's polycrystalline model. The linear reciprocal thickness dependence of electrical resistivity observed has been explained by the "effective mean free path model" of classical size effect. © 1995.
About the journal
JournalSolid State Communications
ISSN00381098
Open AccessNo
Concepts (11)
  •  related image
    Activation energy
  •  related image
    Electric conductivity
  •  related image
    Grain boundaries
  •  related image
    Polycrystalline materials
  •  related image
    Semiconducting films
  •  related image
    Semiconducting lead compounds
  •  related image
    X ray diffraction
  •  related image
    CONDUCTION ACTIVATION ENERGY
  •  related image
    LEAD TIN TELLURIDES
  •  related image
    SETO'S POLYCRYSTALLINE MODELS
  •  related image
    Thin films