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Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)
Nandigana Krishna Mohan, Mahendra Prasad Kothiyal, Rajpal Singh Sirohi
Published in Optical Society of American (OSA)
2006
Volume: 14
   
Issue: 24
Pages: 11598 - 11607
Abstract
Digital speckle pattern interferometry (DSPI) and digital shearography (DS) are well known optical tools for qualitative as well as quantitative measurements of displacement components and its derivatives of engineering structures subjected either static or dynamic load. Spatial phase shifting (SPS) technique is useful for extracting quantitative displacement data from the system with only two frames. Optical configurations for DSPI and DS with a double aperture mask in front of the imaging lens for spatial phase shifting are proposed in this paper for the measurement of out-of-plane displacement and its first order derivative (slope) respectively. An error compensating four-phase step algorithm is used for quantitative fringe analysis. © 2006 Optical Society of America.
About the journal
JournalOptics Express
PublisherOptical Society of American (OSA)
ISSN10944087
Open AccessNo
Concepts (10)
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    Digital devices
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    Interferometry
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    OPTICAL INSTRUMENT LENSES
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    Pattern recognition
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    Speckle
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    DIGITAL SHEAROGRAPHY (DS)
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    DIGITAL SPECKLE PATTERN INTERFEROMETRY (DSPI)
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    OPTICAL TOOLS
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    SPATIAL PHASE SHIFTING (SPS)
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    Phase shift