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Ultrasonic TOFD flaw sizing and imaging in thin plates using embedded signal identification technique (ESIT)
Published in
2004
Volume: 46
   
Issue: 9
Pages: 537 - 542
Abstract
The ultrasonic Time-of-Flight Diffraction (TOFD) technique is a well developed technique for sizing defects in thick sections (thickness >10 mm). Attempt has been made here to extend this technique for thin sections (6-10 mm). An automated defect sizing algorithm using the Embedded Signal Identification Technique (ESIT) was developed for separating partially superimposed signals often encountered in thin sections and the results were compared with the manual sizing method. Both EDM notches and more realistic fatigue cracks in thin section were used to evaluate the proposed technique.
About the journal
JournalInsight: Non-Destructive Testing and Condition Monitoring
ISSN13542575
Open AccessNo
Concepts (10)
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    Algorithms
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    Cracks
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    Fatigue of materials
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    Imaging techniques
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    Inspection
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    Nondestructive examination
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    AUTOMATED DEFECT SIZING ALGORITHM
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    EMBEDDED SIGNAL IDENTIFICATION TECHNIQUE
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    THIN PLATES
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    Ultrasonics