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Space Charge Limited Currents (SCLC) In Amorphous Hydrogenated Silicon (A-Si:H)
Published in SPIE
1987
Abstract

Space charge limited current measurement has emerged as a simple dependable spectroscopy to study the gap states in a-Si:H. In this paper we discuss this measurement along with its sensitivity, advantages and disadvantages.

About the journal
PublisherData powered by TypesetSPIE
Open AccessNo