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Nano scale tilt measurement using a polarizing phase shifting cyclic interferometer
Valiyaparambil Chacko Pretheesh Kumar,
Published in Elsevier Ltd
2019
Volume: 120
   
Abstract
This paper presents an improved method of high precision tilt measurement using a phase shifting cyclic interferometer. Tilt measurement with a cyclic interferometer is a highly stable and reliable experimental technique and tilts as low as 5 μrad has been reported using the same. Here we employ Polarizing Phase Shifting Interferometry (PPSI) as well as multiple reflections for improving the sensitivity. Using a combination of these two techniques tilts as low as 500 nrad has been measured. © 2019 Elsevier Ltd
About the journal
JournalData powered by TypesetOptics and Laser Technology
PublisherData powered by TypesetElsevier Ltd
ISSN00303992
Open AccessNo
Concepts (11)
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    Interferometers
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    Nanotechnology
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    Experimental techniques
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    High-precision
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    Highly stables
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    MULTIPLE REFLECTIONS
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    PHASE SHIFTING INTERFEROMETRY
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    PHASE-SHIFTING
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    POLARIZATION PHASE
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    TILT MEASUREMENT
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    Interferometry