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Indication of thermal roughening in the retrieved mean inner potential across a Σ5 grain boundary in SrTiO3 annealed at different temperatures
Piu Rajak, , Sung Bo Lee
Published in Springer New York LLC
Volume: 51
Issue: 3
Pages: 1484 - 1489
We have measured the mean inner potential depth at a Σ5 grain boundary in a SrTiO3 bicrystal by reconstructing the exit-face wave function from an image focal series collected by transmission electron microscopy. We find that, as the annealing temperature increases, the potential depth at the grain boundary exponentially increases. We interpret the temperature dependence of the potential depth as the signature of a grain-boundary thermal roughening transition. © 2015, Springer Science+Business Media New York.
About the journal
JournalData powered by TypesetJournal of Materials Science
PublisherData powered by TypesetSpringer New York LLC
Open AccessNo
Concepts (12)
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    High resolution transmission electron microscopy
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    Strontium alloys
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    Strontium titanates
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    Temperature distribution
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    Transmission electron microscopy
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    Wave functions
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    Annealing temperatures
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    Temperature dependence
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    Grain boundaries