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Huygen-Fresnel Diffraction Model (H-FDM) for the simulation of ultrasonic time-of-flight diffraction technique in 2D geometries
Published in
Volume: 1211
Pages: 2031 - 2037
This paper discusses the evaluation of diffracted signals from cracks in 2D based on a new Huygen-Fresnel Diffraction Model (H-FDM). The model employs the frequency-domain far-field displacement expressions derived by Miller & Pursey [1] in 2D for a line source located on the free surface of a semi-infinite elastic medium. At each frequency in the bandwidth of a pulsed excitation, the complex diffracted field is obtained by summing over the unblocked virtual sources located in the section containing a vertical crack. The time-domain diffracted signal is obtained using standard FFT procedures. The effect of beam refraction from a wedge-based finite transducer has been modeled by treating the finite transducer as an array of line sources. The model has been used for predicting diffracted signals in time-of-flight from the crack like defect. The model allows the evaluation of back wall signal amplitude and lateral wave amplitude as well. Experiments have been carried out on 10 mm thick aluminum sample with surface breaking crack of lengths 2 mm and 4 mm using shear probe shoe. The simulated A-Scan results for the aluminum sample with 2 mm and 4 mm surface breaking lengths compare very well in relative amplitudes and time of arrivals with experiments. The H-FDM model offers a tool to evaluate diffraction and related phenomena quantitatively with modest computational resources. © 2010 American Institute of Physics.
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JournalAIP Conference Proceedings
Open AccessNo