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Fabrication of multilevel spiral phase plates by focused ion beam milling
Anand Vijayakumar
,
Shanti Bhattacharya
Published in
2013
DOI:
10.1117/12.2021061
Volume: 8769
Abstract
A focused Ga+ ion beam is used to mill a multilevel spiral phase plate at an acceleration voltage of 30 kV. Circular spiral phase plate with eight levels is fabricated directly on an indium-tin-oxide coated glass plate. Scanning electron microscopy images demonstrate the realization of multilevel phase plate on glass plate using focused ion beam milling. © 2013 SPIE.
Topics:
Focused ion beam
(62)%
62% related to the paper
,
Ion beam
(60)%
60% related to the paper
and
Scanning electron microscope
(50)%
50% related to the paper
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Fabrication of multilevel spiral phase plates by focused ion beam milling
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Citations (1)
References (11)
Related Papers (3)
Journal Details
Authors (1)
Concepts (15)
Related Papers (3)
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About the journal
Journal
Proceedings of SPIE - The International Society for Optical Engineering
ISSN
0277786X
Open Access
No
Authors (1)
Shanti Bhattacharya
Department of Electrical Engineering
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Concepts (15)
ACCELERATION VOLTAGES
COATED GLASS
FOCUSED ION BEAM MILLING
Indium tin oxide
Optical vortices
PHASE PLATE
Scanning electron microscopy image
SPIRAL PHASE PLATES
Focused ion beams
Glass
Nanotechnology
Precision engineering
Scanning electron microscopy
TIN OXIDES
TIN PLATE
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