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Extraction of electron density profiles from the X-ray reflectivity data of liquid metals
Published in
2009
Volume: 470
   
Issue: 4-6
Pages: 224 - 227
Abstract
A novel method of deducing the parameters of electron density profiles pertaining to the theoretical re-construction of X-ray reflectivity data of liquid metals is proposed and the inter-dependence of various parameters of the electron density is indicated. The crucial role played by the diffusion coefficient, viscosity and critical temperature of the metals in dictating the correlation lengths is pointed out. The applicability of the methodology is demonstrated for the experimental data on the X-ray reflectivity of Ga, In and K. © 2009 Elsevier B.V. All rights reserved.
About the journal
JournalChemical Physics Letters
ISSN00092614
Open AccessNo
Concepts (17)
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    Carrier concentration
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    Electron density measurement
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    Gallium
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    Liquid metals
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    Metal recovery
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    Reflection
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    X ray diffraction
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    Correlation lengths
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    Critical temperatures
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    Diffusion coefficients
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    Electron densities
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    ELECTRON DENSITY PROFILES
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    Experimental datum
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    INTER DEPENDENCES
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    Novel methods
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    X-RAY REFLECTIVITIES
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    Electrons