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Electrical surface-resistivity, dielectric resonance, polarization and magnetic properties of Bi0.5Sr0.5FeO3-δ thin films grown by pulsed laser deposition
, K. Balamurugan, B Ramachandran, Muvvala Krishna Surendra, ,
Published in Institute of Physics Publishing
2014
Volume: 47
   
Issue: 35
Abstract
Polycrystalline and highly preferred (1 0 2̄) orientated Bi 0.5Sr0.5FeO3-δ thin films were grown by pulsed laser deposition (PLD) on n-Si (2 0 0) and MgO (2 0 0) single crystalline substrates respectively. The thin films were inspected using x-ray diffraction, scanning electron microscopy, energy dispersive x-ray spectroscopy and atomic force microscopy techniques. The electrical surface-resistivity, dielectric resonance, electric polarization, and magnetic properties of the thin films were studied. At room temperature, depending on deposition conditions, the polycrystalline thin films grown on n-Si substrates were found to exhibit an electrical surface-resistivity of the order of 103106 ω, a piezoelectric resonance in the frequency range of about 2526 MHz, a relaxor-type ferroelectric hysteresis with a maximum polarization of 0.0150.055μCcm?2 and magnetic hysteresis. Similarly, the thin films grown on MgO substrates exhibited an electrical surface-resistivity of the order of 109 ω, multiple piezoelectric resonances in the frequency range of about 845 MHz, a linear variation of polarization with applied electric field and either a linearly varying magnetization or magnetic hysteresis which depends on the deposition conditions.© 2014 IOP Publishing Ltd Printed in the UK.
About the journal
JournalJournal of Physics D: Applied Physics
PublisherInstitute of Physics Publishing
ISSN00223727
Open AccessNo
Concepts (27)
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    Atomic force microscopy
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    Dielectric resonators
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    Electric fields
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    Ferroelectric materials
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    Iron oxides
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    Magnesia
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    Magnetic hysteresis
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    Magnetic properties
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    Magnetization
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    Piezoelectricity
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    Polarization
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    Pulsed laser deposition
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    Resonance
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    Scanning electron microscopy
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    Silicon
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    Thin films
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    X ray diffraction
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    X ray spectroscopy
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    DEPOSITION CONDITIONS
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    DIELECTRIC RESONANCES
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    Electric polarization
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    Energy dispersive x ray spectroscopy
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    Ferroelectric hysteresis
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    PIEZOELECTRIC RESONANCE
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    Polycrystalline thin film
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    SINGLE CRYSTALLINE SUBSTRATES
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    Deposition