Header menu link for other important links
X
Dielectric and piezoelectric properties of (0.90-x) PIN-xPT-0.10PZ ternary system near morphotropic phase boundary
Published in
2013
Volume: 31
   
Issue: 3-4
Pages: 309 - 315
Abstract
The (0.90-x)Pb(In1/2Nb1/2)O3-xPbTiO 3-0.10PbZrO3 (PINTZ10) ceramics are prepared by solid state reaction and their structural, dielectric and piezoelectric properties near morphotrophic phase boundary (MPB) has been examined systematically. The structure undergoes a gradual change from rhombohedral to tetragonal when the PbTiO3 content (x) is increased. From the frequency and temperature dependent dielectric measurement it is found that the dielectric relaxation (ΔT) decreases with Ti4+ substitution. Even though the MPB of this ternary system is formed with lower PT content (0.62PIN-0.28PT-0.10PZ), the substitution of Zr4+ in the B site maintains the transition temperature (Tm) at 300 C resembling its binary, 0.67PIN-0.37PT. The higher saturation polarization obtained for x = 0.27 and the high piezoelectric co-efficient obtained for x = 0.29 substantiate the existence of MPB between these two compositions. © 2013 Springer Science+Business Media New York.
About the journal
JournalJournal of Electroceramics
ISSN13853449
Open AccessNo
Concepts (15)
  •  related image
    DIELECTRIC AND PIEZOELECTRIC PROPERTIES
  •  related image
    Dielectric measurements
  •  related image
    MORPHOTROPHIC PHASE BOUNDARIES
  •  related image
    Morphotropic phase boundaries
  •  related image
    Piezoelectric
  •  related image
    Relaxor ferroelectric
  •  related image
    Saturation polarization
  •  related image
    Temperature dependent
  •  related image
    Dielectric properties
  •  related image
    Lead
  •  related image
    Piezoelectricity
  •  related image
    Solid state reactions
  •  related image
    STRUCTURAL CERAMICS
  •  related image
    Ternary systems
  •  related image
    Phase boundaries