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Determination of projected potential profiles across interfaces using through focal series reconstruction
, Koch C.T., Rühle M.
Published in Cambridge University Press
2006
Volume: 12
   
Issue: SUPPL. 2
Pages: 1016 - 1017
Abstract

Potential profiles across interfaces can provide useful information about variations in structure, composition, density, ionicity of their constituents, the presence of space charge layers, etc, showing that the ability to measure potential profiles across interfaces is of great importance in the field of material science.

About the journal
JournalData powered by TypesetMicroscopy and Microanalysis
PublisherData powered by TypesetCambridge University Press
Open AccessNo