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Characterization of polarization states of surface plasmon polariton modes by Fourier-plane leakage microscopy
, Frisbie S.P., Regan C.J., Chesnutt C., Ajimo J., Bernussi A.A., Grave de Peralta L.
Published in Elsevier BV
2010
Volume: 283
   
Issue: 24
Pages: 5255 - 5260
Abstract

We demonstrate that the polarization states of guided wave surface plasmon polariton (SPP) modes can be unambiguously identified by introducing a linear polarizer in the optical path of the light within a leakage-based microscope. We show the use of Fourier-plane leakage-based microscopy as a polarization characterization method to study the polarization states of SPP modes excited in plasmonic waveguides. Our results indicate that the inclusion of a linear polarizer provides additional image processing capabilities to leakage-based microscopes.

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PublisherData powered by TypesetElsevier BV
Open AccessNo