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Analysis of random telegraph noise in spin valve heads with ultra-thin free layers
, Jing Zhang None, Ningjia Zhu None, Yiming Huai None, Rana P., Seagle D., Lederman M.
Published in Institute of Electrical and Electronics Engineers (IEEE)
2001
Volume: 37
   
Issue: 4
Pages: 1678 - 1680
Abstract

Random telegraph noise (RTN) in spin valve heads with ultra-thin free layers is analyzed in both time and frequency domain. RTN is characterized by random fluctuation between two meta-stable states and is attributed to thermally activated domain instability. Lifetime of each meta-stable state is changes with bias current, with both being equal when RTN amplitude peaks while asymmetry is near zero. The lifetime at equilibrium can be quantified by the flatness of RTN spectra and is correlated with the normalized peak area under RTN amplitude versus bias current curve. This area scales with the energy barrier associated with RTN. With the same RTN peak area, lifetime at equilibrium is shorter for heads with thinner free layers but otherwise the same structure. Impact on reader instability for ultra-high areal density recording is discussed.

About the journal
PublisherData powered by TypesetInstitute of Electrical and Electronics Engineers (IEEE)
Open AccessNo