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An in-plane insensitive multiaperture speckle shear interferometer for slope measurement
Rajpal Singh Sirohi, Nandigana Krishna Mohan
Published in Elsevier Ltd
1997
Volume: 29
   
Issue: 7
Pages: 415 - 417
Abstract
A modified two-aperture speckle shear interferometer that eliminates the contribution of the in-plane component and its derivative to the phase change, and yields a fringe pattern corresponding to the first-order partial derivatives of the out-of-plane displacement component, is reported in this note. In this method, two laterally sheared object points are viewed axially. The wave fields from these points are independently combined at the image plane of the imaging system. © 1998 Elsevier Science Ltd. All rights reserved.
About the journal
JournalData powered by TypesetOptics and Laser Technology
PublisherData powered by TypesetElsevier Ltd
ISSN00303992
Open AccessNo
Concepts (10)
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    Angle measurement
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    HOLOGRAPHIC INTERFEROMETRY
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    Imaging systems
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    LIGHT INTERFERENCE
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    Speckle
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    FRINGE PATTERNS
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    MULTIAPERTURE SPECKLE SHEAR INTERFEROMETRY
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    SLOPE MEASUREMENT
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    SPECKLE METROLOGY
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    Interferometers