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A single exposure reflection moiré interferometric technique for complete curvature analysis of bent plates
G. Subramanian, Anantha Subramanian
Published in
1997
Volume: 33
   
Issue: 1
Pages: 3 - 7
Abstract
Most known moiré methods need to be repeated three times for getting curvature information in three different in plane directions, for the complete analysis. To overcome this difficulty, a new single exposure moiré interferometric technique is proposed that maps completely partial curvature contours in three different directions of laterally loaded specularly reflecting plate models. Converging HeNe laser light is diffracted by a lens plane cross grating. The 00, +10 and the +01 diffraction orders are permitted through the Fourier transform (FT) plane and collimated to illuminate the plate model. The reflected light from the loaded model records the model with the inherent deformed interferometric cross grating superimposed on it. A posteriori Fourier filtering of the developed recording (moirégram) gives partial curvature contours pertaining to three different in plane directions from which the principal curvatures and the principal directions are obtained. Also, this technique, being a single exposure technique, has the potential for complete bending analysis of plates subjected to lateral impact loading and destructive loading applications, where the repeatability of the event may not be possible.
About the journal
JournalStrain
ISSN00392103
Open AccessNo
Concepts (16)
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    Bending (deformation)
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    Diffraction gratings
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    Electromagnetic wave diffraction
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    Fourier transforms
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    HELIUM NEON LASERS
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    Interferometry
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    Light reflection
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    Structural analysis
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    Structural loads
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    FLEXED PLATES
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    MOIRE INTERFEROMETER
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    MOIREGRAM
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    REFLECTION MOIRE
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    SINGLE EXPOSURE TECHNIQUE
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    TWIST CURVATURE
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    Plates (structural components)