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A new patterning method for microstructural strain mapping of Al-5754 alloy using image correlation
Srinivasan Nagarajan,
Published in Springer International Publishing
2018
Volume: 42
   
Issue: 4
Pages: 453 - 458
Abstract
A new, simple chemical etching based surface patterning method for microstructural strain mapping of Al-5754 alloy is proposed. This method reveals the grain boundaries and micro-constituents of the alloy which can serve as high contrast random dot pattern for microstructural strain calculation using digital image correlation. The suitability of the surface pattern developed by this method to accurately map the microstructural strain evolution during tensile deformation with adequate spatial resolution to address intragranular strain heterogeneities has been quantitatively assessed and demonstrated. © 2018, The Society for Experimental Mechanics, Inc.
About the journal
JournalData powered by TypesetExperimental Techniques
PublisherData powered by TypesetSpringer International Publishing
ISSN07328818
Open AccessNo
Concepts (15)
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    Etching
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    Grain boundaries
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    Image analysis
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    Mapping
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    Single crystals
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    Strain measurement
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    Chemical etching
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    DIGITAL IMAGE CORRELATIONS
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    MICROSTRUCTURAL STRAINS
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    RANDOM-DOT PATTERN
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    Spatial resolution
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    Strain heterogeneity
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    SURFACE PATTERNING METHODS
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    Tensile deformation
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    Aluminum alloys