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View more info for "80Kb 10ns read cycle logic Embedded High-K charge trap Multi-Time-Programmable Memory scalable to 14nm FIN with no added process complexity"
Journal | Data powered by TypesetIEEE Symposium on VLSI Circuits, Digest of Technical Papers |
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Publisher | Data powered by TypesetInstitute of Electrical and Electronics Engineers Inc. |
Open Access | No |